Course Meeting Times
Lectures: 2 sessions / week, 1.5 hours / session
Prerequisites
Either or both 2.010, 15.075 or equivalent (either or both statistics or classical controls).
Required Text
Montgomery, Douglas C. Introduction to Statistical Quality Control. 5th ed. New York, NY: Wiley, 2004. ISBN: 9780471656319.
May, Gary S., and Costas J. Spanos. Fundamentals of Semiconductor Manufacturing and Process Control. Hoboken, NJ: Wiley-Interscience, 2006. ISBN: 9780471784067.
Reference Texts
For Processes
Kalpakjian, S. Manufacturing Processes for Engineering Materials. 3rd ed. Menlo Park, CA: Addison Wesley, 1996. ISBN: 9780201823707.
For Statistical Analysis, SPC and Designed Experiments
Devor, R. E., T. Chang, and J. W. Sutherland. Statistical Quality Design and Control. New York, NY: Macmillan, 1992. ISBN: 9780023291807.
Hogg, R. V., and J. Ledotter. Engineering Statistics. New York, NY: Macmillan, 1987. ISBN: 9780023557903.
Bendat, J. S., and A. G. Piersol. Random Data. 2nd ed. New York, NY: Wiley Interscience, 2000. ISBN: 9780471317333.
For Feedback Control and Stochastic Control
Ogata, Katsuhiko. Modern Control Engineering. 3rd ed. Upper Saddle River, NJ: Prentice Hall, 1996. ISBN: 9780132273077.
Friedland, B. Control System Design. New York, NY: McGraw Hill, 1985. ISBN: 9780070224414.
Grading
ACTIVITIES | PERCENTAGES |
---|---|
Problem sets | 50% |
Quizzes | 40% |
Class participation | 10% |
Assignments
All except Optimization Project are to be individual efforts.